Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

BALTIMORE–At the International Test Conference here today, Synopsys Inc. announced new advanced test modeling technology that will more than triple the capacity of the company's design-for-test ...

Mountain View, Calif.—Synopsys Inc. announced availability of its TetraMAX small delay defect automatic test pattern generator (ATPG) for use by design organizations worldwide to improve the quality ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...