Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...

Depending upon the distance between the surface of a capacitance probe and a target source, the electrical capacitance that is formed between these two objects will vary. In an effort to improve ...

An optimal way to determine an op amp's input capacitance. Steps involved in making the input-capacitance measurement. 1. With a series resistor at the op-amp input, the input capacitance of the op ...

BEAVERTON, OR. Tektronix Inc. has announced the availability of two new source-measure unit (SMU) modules for the Keithley 4200A-SCS parameter analyzer that can perform low-current measurements even ...

Scanning microwave microscopy (SMM) is a scanning probe method that uses the S11 parameter to calculate the local tip-sample microwave impedance. This impedance is affected by the sample’s local ...

This circuit for measurement of inductance and capacitance can be used to test whether the values of inductors and capacitors quoted by the manufacturer are correct. The principle used in the circuit ...

C-V testing has long been used to determine a variety of semiconductor parameters on many different devices and structures, ranging from MOSCAPs, MOSFETs, bipolar junction transistors, and JFETs to ...

EINPresswire/ -- Vitrek, LLC (“Vitrek”) a leader in high-performance test and measurement equipment, announced today that it will showcase its expanded Accumeasure capacitance measurement product line ...