Semiconductor fabs—among the most heavily instrumented manufacturing facilities in today’s industrial landscape—continue to grow and generate data throughout the manufacturing process, making the term ...

ICs for automotive applications must satisfy long-term reliability requirements by being insensitive to hard electromechanical stresses. Recently, some studies revealed that the long term robustness ...

Part Average Testing, or PAT, is used for outlier detection for a single measurement, a requirement for automotive electronics, found in the Automotive Electronics Councils‘ AEC – Q001 Rev-D ...

All companies striving to survive and grow in today’s worldwide electronics industry recognize the value of performing design, development, and troubleshooting tests. These tests should be done early ...