AZOM

Lithium-Ion Battery Component Characterization via SEM, EDS and ToF-SIMS in FIB-SEM Tomography

A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
AZOM

Accelerating Multi-Modal Materials Characterization with Plasma FIB-SEM

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...
AZoNano

Sample Characterization with High Current Plasma FIB-SEM

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
AZoNano

Nanofluidic Devices for DNA Optical Mapping can be Fabricated and Characterized with FIB-SEM

Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...