EDN

Process variation: you can’t ignore statistics any more

I like to say that “you can’t ignore the physics any more” to point out that we have to worry about lots of physical effects that we never needed to consider. But “you can’t ignore the statistics any ...
EDN

Solido Design Automation Launches Industry’s First Extensible Process Variation Solution for Transistor-Level Designers

San Jose, Calif. – Jan. 22, 2009 – Solido Design Automation, a leading developer of process variation solutions for transistor-level design of analog/mixed-signal, custom digital and memory integrated ...
Semiconductor Engineering

Process Corner Explosion

The number of corners that need to be checked is exploding at 7nm and below, fueled by everything from temperature and voltage to changes in metal. Lowering risk and increasing predictability of an ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...