Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
The TX53 Computer on Module from Strategic Test Corp. integrates the ARM Cortex A8-based Freescale multimedia processor i.MX53 with 1GHz clock speed The TX53 Computer on Module from Strategic Test ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback