The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...
(CNN) — The Biden administration announced on Monday that the US Department of Defense and US Department of Health and Human Services are working with Australian company Ellume to provide more of its ...
NPR's Adrian Florido speaks with Estela Raychaudhuri, president of InBios International, about challenges faced by coronavirus rapid test kit manufacturers amid the current surge. The hottest ...
Aeroflex announced the IFR 6000, a ramp test set based on the IFR 4000 navigation communications. One main user screen for each functional mode of operation is required for most tests. This instrument ...
To ensure a high-quality test, today’s SoCs require applying multiple types of test patterns. Many patterns are created using scan and ATPG tools. The same ATPG tools that produce stuck-at, transition ...
This project originated from the need to produce a linear crystal-controlled ramp signal for an HP 8620C RF sweep oscillator. It is inspired by a previously published ramp generator design [1]. That ...
Aeroflex offers a software upgrade (Version 3.0) to expand its IFR ATC-601 ramp test set to include enhanced surveillance and ADS-B testing capabilities, which makes it a more versatile tool for Mode ...
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