For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
Failures have been present in electronic products since the days of vacuum tubes, and despite enormous development and production improvements, no manufacturing technique can guarantee a 100% ...
Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
February 19, 2013. Agilent Technologies Inc. has announced the launch of the Agilent x1149 boundary-scan analyzer, which it is exhibiting at IPC APEX EXPO. The x1149 boundary-scan analyzer is a ...
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