Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...

A complete test plan includes testing the logic and all memories. That is, until the boss adds, “Oh, by the way, the DFT guy left the company, so you also get to do the test stuff. Choose any tools ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...