Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Costco regulars know that the worst part of shopping the warehouse retailer is getting out of it. Customers pushing piled-high carts mob the front of the stores, waiting more or less patiently to get ...

In the mid 80s, a group of industry pioneers, the Joint Test Action Group (JTAG), started meetings in a hotel near the Amsterdam airport, invited by Philips, to put down the first stone of one of the ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...