Landing AI, a company that empowers customers to harness the business value of AI by providing enablement tools and transformation programs, recently introduced LandingLens, an end-to-end visual ...

Google launched Visual Inspection AI, a new service to identify production defects in manufacturing units. The service uses the state-of-the-art computer vision models developed by the AI research ...

The NVIDIA TAO 6.0 integration delivers advanced foundation models, fine-tuning capabilities, prompt‑based segmentation, and in‑context segmentation Manufacturers benefit from enhanced tools for ...

The Pharma Innovation Awards represent an annual recognition of new technologies and services that aim to help improve product quality, reduce risks, and enhance pharmaceutical production efficiency.

By Edwin NorascoThe customs cargo clearance process begins with declarations, where importers submit requisite information regarding the goods prior to their arrival.This information is then reviewed ...

The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...

IBM on Tuesday is launching a new Watson-powered Internet of Things (IoT) service designed to help manufacturers streamline their assembly line inspection process. While Watson is used to process and ...

Recent incidents of bacterial infections in patients linked to dirty arthroscopic shavers and endoscopes have spurred dramatic change in device reprocessing and sterilization strategies. Yet many ...

GE Digital today introduced a purpose-built Visual Intelligence Platform for utilities. The SaaS solution is designed to ingest all forms of visual inspection data and executes workflows and automated ...

As companies manufacture goods, human inspectors review them for defects. Think of a scratch on smartphone glass or a weakness in raw steel that could have an impact downstream when it gets turned ...

For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...