FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix Designed to enhance the safety of operators and equipment; complies with regulations SANTA ROSA, ...
FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Single die packages and products have been the norm for decades. Moreover, so has multi-chip modules (MCMs) or system in package (SiP) for quite some time. Understandably, with ASICs and SoCs becoming ...
CLEVELAND — Keithley Instruments Inc. today introduced two new software modules for its Automated Parametric Test (APT) systems to significantly increase tester utilization by eliminating potential ...
Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
Aehr Test Systems (NASDAQ:AEHR) said Tuesday it received an evaluation order from a leading artificial intelligence chip supplier to test its wafer-level burn-in technology. The program will be ...
FREMONT, CA / ACCESSWIRE / December 16, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced a significant milestone with the ...
FREMONT, CA / ACCESSWIRE / January 25, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced that a new ...
FREMONT, Calif., March 01, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has ...
I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...
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