Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...
The pressure to increase chip density has caused designers to leapfrog Moore’s Law and leverage other technologies beyond sheer feature size to address it. Since Gordon E. Moore, co-founder of Intel, ...
In the IC design flow, design-for-test is often an afterthought. First, the design is coded, then simulated, then synthesized, and only after all that – usually months into the design cycle – it's ...
BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...
The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels ...
Global leader in design-for-test (DFT) technology paves the way for mainstream adoption of 3D ICs Innovative solution dramatically streamlines DFT cycles for highly complex multi-die designs PLANO, ...
To meet the increasing size of ICs, required to accommodate the integration of billions of transistors in order to deliver the performance required for tasks such as AI and autonomous vehicles, Mentor ...
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