There are have been numerous papers written on the techniques that can be employed during integrated circuit (IC) design to achieve better overall manufacturability and yield. These ...
In moving to nanometer process technologies at 130 nm and below, semiconductor designers face a variety of physical and electrical effects that can significantly degrade circuit performance. For these ...
September 25, 2012. ProPlus Design Solutions Inc., a provider of design for yield (DFY) solutions that integrate device modeling, parallel SPICE simulation, and statistical analysis, today unveiled ...
Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...
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