Nasdaq

PyroGenesis Confirms Third-Party SEM Analysis Supports Pilot-Scale Fumed Silica Morphology Consistent with Commercial-Grade Fumed Silica

MONTREAL, July 28, 2025 (GLOBE NEWSWIRE) -- PyroGenesis Inc. (“PyroGenesis”) (http://pyrogenesis.com) (TSX: PYR) (OTCQX: PYRGF) (FRA: 8PY1), a high-tech company ...
AZOM

Forensic Insights: Analyzing Glass Particles from Smartphone Damage using SEM, EDS, and Micro-CT

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
Semiconductor Engineering

Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
AZOM

Vitamin C Particle Mapping with SEM and AFM Technology

Vitamin C tablets’ surface roughness is key to defining their surface morphology and, therefore, their delivery rate and interaction time with external stimuli. Surface roughness can be observed via ...