SAN FRANCISCO, Jan. 21, 2026 /PRNewswire/ -- PI (Physik Instrumente) announced a new technology platform for electro-optical wafer-level testing designed to validate electrical and optical device ...
Parallel piezo aligners with fly height sensors enable faster PIC wafer testing. SAN FRANCISCO, Jan. 21, 2026 /PRNewswire/ -- PI (Physik Instrumente) announced a new technology platform for ...
Abstract: In this letter, we model the mutual coupling of a time-modulated array (TMA) and investigate methods for characterizing the mutual coupling using complex-quantity and magnitude-only ...
Abstract: This study investigates alignment and coupling between a photonic integrated circuit (PIC) and a mixed-mode fiber array (FA), where one of the channels in the normally single-mode (SM) array ...
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