Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
Abstract: Convolutional Neural Networks (CNNs) are extensively utilized for image classification due to their ability to exploit data correlations effectively. However, traditional CNNs encounter ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback