Discusses Preliminary Financial Results, Churn Impact, and Strategic Progress in Key Verticals February 3, 2026 8:00 AM ...
Abstract: The research proposes a new forensic face sketching and recognition system built on deep learning techniques to improve criminal identification capabilities. The method uses a mix of ...
Abstract: Semiconductor manufacturing requires highly precise defect detection to ensure product quality and yield. This paper presents a deep learning-based defect detection framework using Faster ...